Impact of Interconnect Variation on Ultra Low Power Clock System

Authors

  • R.A Walunj Associate Professor, Matoshri College Of Engineering & Research Centre, Nashik, Maharashtra, India
  • G.K. Kharate Professor, Matoshri College Of Engineering & Research Centre, Nashik, Maharashtra, India

Keywords:

ultra-low power, H-tree CDN, variability, sub threshold

Abstract

By virtue of high component density and enhanced performance state-of-the-art integrated chips, power density has increased considerably. Increased power consumption deteriorates the performance, endangers the reliability and increases the packaging cost and therefore power consumption has emerged as a forefront design metric. An attempt to reduce the power consumption hampers the overall performance and robustness of the system. All these factors viz power, reliability and performance of a digital synchronous system are significantly influenced by the clock system and therefore design of low power and robust clock system becomes obvious. For moderate and low frequency applications having stringent power budget, sub threshold circuits satisfies the demand of ultra-low power. However, due to exponential V-I characteristics, robust design is a critical concern in sub threshold regime. Furthermore, high component density and increased complexity leads to increased wire density. Therefore, along with the challenges posed by performance degradation and PVT variability of device in sub threshold, there is need to investigate the impact of interconnect variation on clock system performance parameters in this regime. This paper therefore, explores the impact of variation in interconnect parameters in buffered as well as unbuffered CDN of low power clock system.

How to cite this article:
Walunj RA, Kharate GK. Impact of Interconnect Variation on Ultra Low Power Clock System. J Adv Res Power Electro Power Sys 2021; 8(1&2):5-13.

 

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Published

2021-05-22